Ultramicroscopy, 18 décembre 2001, Volume : 92, Numéro : 2
We discuss improved procedures for fitting a power-law background to an ionization edge in an electron energy-loss spectrum. They place constraints on the...
We discuss how an inner-shell electron energy-loss spectrum can be processed using Bayesian (maximum-entropy or maximum-likelihood) deconvolution to...
Ultramicroscopy, avril 2001, Volume : 87, Numéro : 3
We have shown that energy-loss spectroscopy in a medium-voltage transmission electron microscope can measure concentrations of boron (in a carbon matrix) down...
Although the theory of high-angle elastic scattering of fast electrons is well developed, accurate calculation of the incident-energy threshold and cross...