https://catalogue-scientifique.canada.ca/record=2115599~S6*frc
Rechercher Singh, Rajeev; Rechercher Bian, Zhixi; Rechercher Zeng, Gehong; Rechercher Zide, Joshua; Rechercher Christofferson, James; Rechercher Chou, Hsu-Feng; Rechercher Gossard, Art; Rechercher Bowers, John; Rechercher Shakouri, Ali
california univ santa cruz electrical engineering dept, 2005
The transient Harman technique is used to characterize the cross-plane ZT of InGaAs/InGaAlAs superlattice structures with embedded ErAs nanoparticles in the...
Publication gouvernementale