https://publications-cnrc.canada.ca/fra/voir/objet/?id=7f7a1018-88b9-4f92-be99-d7d8c0df9084
Proceedings. IS and T/SPIE International Symposium on Electronic Imaging, 2011, Volume : 78645
When considering probabilistic pattern recognition methods, especially methods based on Bayesian analysis, the probabilistic distribution is of the utmost...
Article de périodique (revue)
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