https://catalogue-scientifique.canada.ca/record=2265926~S6*frc
Rechercher Barvosa-Carter, W; Rechercher Twigg, M. E; Rechercher Yang, M. J; Rechercher Whitman, L. J
naval research lab washington dc, 2001
We have used cross-sectional scanning tunneling microscopy (XSTM) and transmission electron microscopy (TEM) to study InAs/In(0.28)Ga(0.72)Sb/InAs/AlSb...
Publication gouvernementale