https://publications-cnrc.canada.ca/fra/voir/objet/?id=60bf43bb-8525-4626-98a4-d8506d30fe51
Rechercher Hettler, Simon; Rechercher Kano, Emi; Rechercher Dries, Manuel; Rechercher Gerthsen, Dagmar; Rechercher Pfaffmann, Lukas; Rechercher Bruns, Michael; Rechercher Beleggia, Marco; Rechercher Malac, Marek
Ultramicroscopy, Elsevier, 28 septembre 2017, Volume : 184
A systematic study on charging of carbon thin films under intense electron-beam irradiation was performed in a transmission electron microscope to identify the...
Article de périodique (revue)