Microscopy, Oxford University Press, 15 novembre 2020, Volume : 70, Numéro : 1
In this paper, we review the current state of phase plate imaging in a transmission electron microscope. We focus especially on the hole-free phase plate...
Review of Scientific Instruments, AIP, 25 août 2014, Volume : 85, Numéro : 8
Electron tomography is a method whereby a three-dimensional reconstruction of a nanoscale object is obtained from a series of projected images measured in a...
Microscopy and Microanalysis, Cambridge University Press, 11 août 2011, Volume : 17, Numéro : S2
Electron energy-loss spectroscopy (EELS) is routinely used to estimate local specimen thickness in a TEM. The relative specimen thickness is conveniently...
Microscopy and Microanalysis, Cambridge University Press, 1 juillet 2010, Volume : 16, Numéro : S2
Thickness measurement of nanoscale objects is critical in many applications but when the thickness to be measured falls below about 10 nm, the usual methods of...
Scattering contrast measurements were performed on thin films of amorphous carbon and polycrystalline Au, as well as single-crystal MgO nanocubes. Based on the...
Ultramicroscopy, Elsevier, 5 mars 2012, Volume : 118
Decrease of the irradiation dose needed to obtain a desired signal-to-noise ratio can be achieved by Zernike phase-plate imaging. Here we present results on a...