https://publications-cnrc.canada.ca/fra/voir/objet/?id=2b05cac9-bfe9-498e-a33a-452ffa47870a
Rechercher Helmly, S; Rechercher Hiesgen, R; Rechercher Morawietz, T; Rechercher Yuan, X.-Z; Rechercher Wang, H; Rechercher Friedrich, K.A
Journal of the Electrochemical Society, 2013, Volume : 160, Numéro : 6
Atomic force microscopy (AFM) and scanning electron microscopy (SEM) were used to investigate platinum (Pt) deposition in the membrane of degraded proton...
Article de périodique (revue)