IEEE transactions on reliability (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : IEEE transactions on reliabilityhttps://catalogue-scientifique.canada.ca/record=1013029~S6*frcRechercher American Society for Quality. Electronics & Communications Division; Rechercher Institute of Electrical and Electronics Engineers. Professional Technical Group on ReliabilityInstitute of Electrical and Electronics Engineers, ISSN : 1558-1721Périodique (revue)
IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Societyhttps://catalogue-scientifique.canada.ca/record=1954255~S6*frcRechercher IEEE Reliability Society; Rechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersInstitute of Electrical and Electronics Engineers, ISSN : 1530-4388Périodique (revue)
IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Council (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Councilhttps://catalogue-scientifique.canada.ca/record=1043452~S6*frcRechercher IEEE Reliability Society; Rechercher IEEE Components, Hybrids, and Manufacturing Technology Society; Rechercher Components, Packaging & Manufacturing Technology Society; Rechercher IEEE Electron Devices Society; Rechercher IEEE Solid-State Circuits CouncilInstitute of Electrical and Electronics Engineers, ISSN : 0894-6507Périodique (revue)
Reliability physics 1980 : 18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980 (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : Reliability physics 1980 : 18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980https://catalogue-scientifique.canada.ca/record=1216711~S6*frcRechercher IEEE Reliability Society; Rechercher IEEE Electron Devices SocietyElectron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 1980Livre
1980 proceedings annual Reliability and Maintainability Symposium : San Francisco, CA, USA, 1980 January 22-24 : the forum for the assurance technologies (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : 1980 proceedings annual Reliability and Maintainability Symposium : San Francisco, CA, USA, 1980 January 22-24 : the forum for the assurance technologieshttps://catalogue-scientifique.canada.ca/record=1215740~S6*frcRechercher RAMS; Rechercher IEEE Reliability Society; Rechercher IEEE Reliability Group; Rechercher Institute of Electrical and Electronics EngineersInstitute of Electrical and Electronics Engineers, 1980Livre
ISSRE 2005 : 16th IEEE International Symposium on Software Reliability Engineering : proceedings : 8-11 November 2005, Chicago, Illinois (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : ISSRE 2005 : 16th IEEE International Symposium on Software Reliability Engineering : proceedings : 8-11 November 2005, Chicago, Illinoishttps://catalogue-scientifique.canada.ca/record=2093783~S6*frcRechercher IEEE Computer SocietyIEEE Computer Society, 2005Actes de conférence
Mutation 2000 : a symposium on mutation testing (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : Mutation 2000 : a symposium on mutation testinghttps://catalogue-scientifique.canada.ca/record=1960292~S6*frcRechercher Wong, W. EricWiley, 2001Actes de conférence
Electronic Components Reliability Seminar : April 25, 1981 (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : Electronic Components Reliability Seminar : April 25, 1981https://catalogue-scientifique.canada.ca/record=1867828~S6*frcRechercher IEEE Reliability SocietyInstitute of Electrical and Electronics Engineers, Reliability Society, 1981Actes de conférence
2004 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 18-21, 2004 (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : 2004 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 18-21, 2004https://catalogue-scientifique.canada.ca/record=2048080~S6*frcRechercher IEEE Reliability Society; Rechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersElectron Devices Society, 2004Actes de conférence
2004 IEEE International Reliability Physics Symposium : 42nd annual, Phoenix, Arizona, April 25-29, 2004 : proceedings (ouvrira une nouvelle fenêtre)Sauvegarder cet élément : 2004 IEEE International Reliability Physics Symposium : 42nd annual, Phoenix, Arizona, April 25-29, 2004 : proceedingshttps://catalogue-scientifique.canada.ca/record=2028854~S6*frcRechercher IEEE Reliability Society; Rechercher IEEE Electron Devices Society; Rechercher Institute of Electrical and Electronics EngineersInstitute of Electrical and Electronics Engineers, 2004Actes de conférence