https://publications-cnrc.canada.ca/fra/voir/objet/?id=b06b4cce-70fb-4888-8feb-91b099aa6269
Rechercher Malac, Marek; Rechercher Kimoto, Koji; Rechercher Egerton, Ray; Rechercher Shekhar, Prashant; Rechercher Jacob, Zubin; Rechercher Taniguchi, Yoshifumi; Rechercher Gaind, Vaibhav
Microscopy and Microanalysis, Cambridge University Press, 27 août 2014, Volume : 20, Numéro : S3
Electron energy loss spectroscopy (EELS) in a TEM can measure the optical response of individual nanostructures at high spatial resolution [1] and obtain...
Article de périodique (revue)