https://catalogue-scientifique.canada.ca/record=2175032~S6*frc
Rechercher Nalladega, Vijayaraghava; Rechercher Sathish, Shamachary; Rechercher Klosterman, Don; Rechercher Jata, Kumar V; Rechercher Blodgett, Mark P
dayton univ oh research inst, 2007
Atomic Force Microscope (AFM) based eddy current imaging technique has been used to characterize carbon fiber reinforced composites and carbon nanofibers...
Publication gouvernementale