https://catalogue-scientifique.canada.ca/record=2121207~S6*frc
Rechercher Barnes, Paul N; Rechercher Mukhopadhyay, Sharmila M; Rechercher Haugan, Timothy J; Rechercher Krishnaswami, Swaminathan; Rechercher Tolliver, Justin C; Rechercher Maartense, Iman
air force research lab wright-patterson afb oh propulsion directorate, 2003
X-ray photoelectron spectroscopy (XPS) depth profiling was used to investigate the compositional and chemical profile of a typical YBCO coated conductor...
Publication gouvernementale