https://publications-cnrc.canada.ca/fra/voir/objet/?id=8aef6a57-3ab1-437b-9ff3-e6d299007468
Rechercher Taylor, Rod; Rechercher Hnatovsky, C; Rechercher Simova, E; Rechercher Rayner, David; Rechercher Mehandale, M; Rechercher Bhardwaj, V. R; Rechercher Corkum, Paul
Optics Express, 2003, Volume : 11, Numéro : 7
The combination of selective chemical etching and atomic force microscopy has been used for the first time to make ultra-high spatial resolution (20 nm) index...
Article de périodique (revue)