https://catalogue-scientifique.canada.ca/record=2181960~S6*frc
Rechercher Ramkumar, C; Rechercher Prokofyeva, T; Rechercher Seon, M; Rechercher Holtz, M; Rechercher Choi, K; Rechercher Yun, J; Rechercher Nikishin, S. A; Rechercher Temkin, H
texas tech univ lubbock dept of electrical engineering, 2001
We report post-growth micro-Raman stress mapping of cracks in GaN, AlN, and AlxGa1-xN grown on (111) oriented silicon. Cracks with an average spacing of ̃ 100...
Publication gouvernementale