https://publications-cnrc.canada.ca/fra/voir/objet/?id=72bbc758-a11b-40e7-80c2-aa747cf47684
Rechercher Zhang, Hai; Rechercher Sfarra, Stefano; Rechercher Osman, Ahmad; Rechercher Szielasko, Klaus; Rechercher Stumm, Christopher; Rechercher Genest, Marc; Rechercher Maldague, Xavier
IEEE Transactions on Industrial Informatics, IEEE, 2 mai 2018
In this paper, terahertz time-domain spectroscopy (THz-TDS) is used for the first time to detect fabricated defects in a glass fiber-skinned lightweight...
Article de périodique (revue)