https://publications-cnrc.canada.ca/fra/voir/objet/?id=abd887d8-0c6f-41a0-a8a8-e8ecb90036b5
Rechercher Tran, Hue X; Rechercher Leslie, James D; Rechercher Buchanan, Steve; Rechercher Dubowski, Jan J
Laser-induced thin film processing, SPIE--the International Society for Optical Engineering, 1995
An EXACTA 2000 Faraday-modulated fast-nulling ellipsometer operating at 6328 angstrom has been used in situ to measure the polarizer (P) and analyzer (A)...
Article de périodique (revue)