https://publications-cnrc.canada.ca/fra/voir/objet/?id=406092d1-80c0-4a84-85c5-19e1f747326e
Rechercher Cao, W; Rechercher Masnadi, M; Rechercher Eger, S; Rechercher Martinson, M; Rechercher Xiao, Q.-F; Rechercher Hu, Y.-F; Rechercher Baribeau, J.-M; Rechercher Woicik, J. C; Rechercher Hitchcock, A. P; Rechercher Urquhart, S. G
Applied Surface Science, 9 novembre 2012, Volume : 265
We have quantitatively measured the angle dependence in the Silicon 1s X-ray absorption spectra of strained Si1-xGex thin films prepared by epitaxial growth on...
Article de périodique (revue)