https://publications-cnrc.canada.ca/fra/voir/objet/?id=fc285118-2b56-4923-9be2-7662c56ab7c9
Rechercher Wey, I-Chyn; Rechercher Chen, You-Gang; Rechercher Yu, Changhong; Rechercher Chen, Jie; Rechercher Wu, An-Yeu (Andy)
IEEE Asian Solid-State Circuits Conference, 2007
As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the...
Article de périodique (revue)