https://publications-cnrc.canada.ca/fra/voir/objet/?id=0895d9d9-89e5-4388-b9b6-284305171396
Rechercher Hnatovsky, C; Rechercher Taylor, R. S; Rechercher Simova, E; Rechercher Bhardwaj, V. R; Rechercher Rayner, D. M; Rechercher Corkum, P. B
Journal of Applied Physics, 2005, Volume : 98, Numéro : 1
An ultrahigh-resolution (20nm) technique of selective chemical etching and atomic force microscopy has been used to study the photoinduced modification in...
Article de périodique (revue)