https://publications-cnrc.canada.ca/fra/voir/objet/?id=d987d2f6-e8ed-4d10-8ce9-913a0e529651
Rechercher Li, Peng; Rechercher Kupsta, Martin; Rechercher Cui, Kai; Rechercher Malac, Marek; Rechercher Hosseinkhannazer, Hooman; Rechercher Ning, Yuebin; Rechercher LaForge, Joshua; Rechercher Beaudry, Allan; Rechercher Brett, Michael
Microscopy and Microanalysis, Cambridge University Press, 23 novembre 2012, Volume : 18, Numéro : S2
Electron tomography (ET) can be used to obtain three-dimensional (3D) information about nanoscale objects. Alignment of the images in the ET tilt series and...
Article de périodique (revue)