https://publications-cnrc.canada.ca/fra/voir/objet/?id=9a955279-55ed-4dc8-9a67-2f024bd4d93d
Rechercher Landheer, D; Rechercher Gupta, J. A; Rechercher Wu, X; Rechercher Sproule, G. I; Rechercher Moisa, S; Rechercher Quance, T; Rechercher Graham, M. J; Rechercher Baumvol, I. J. R; Rechercher Morais, J; Rechercher Lennard, W. N
Materials Research Society Workshop Series: International Workshop on Devices Technology: Alternatives to SiO2 as Gate Dielectric for Future Si-Based Microelectronics
Article de périodique (revue)